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75 Micron Amorphous Silicon A Si For Various Fields A Si DR Non Destructive Testing

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75 Micron Amorphous Silicon A Si For Various Fields A Si DR Non Destructive Testing

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Brand Name : HUATEC

Model Number : H2317HSC-CG

Certification : CE ISO GOST

Place of Origin : China

MOQ : 1

Packaging Details : export standard carton package

Material : amorphous silicon sensor

Temperature : 10-35°C (operating)；-10~50°C (storage)

Humidity : 30-70% RH (non-condensing)

Product name : DR Digital Flat Panel Detector

Receptor Type : a-Si

Scintillator : CsI:TI

Active Area : 230.4 x 172 mm

Pixel Pitch : 75μm

Resolution : 3072x 2304

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75 Micron Amorphous Silicon A-Si For Various Fields A-Si DR And Non-Destructive Testing

H2317HSC-CG It is a lightweight flat panel detector based on amorphous silicon sensors, suitable for X-ray detection

Sensor
Receptor Type a-Si

Scintillator CsI:TI

Active Area 230.4 x 172 mm

Resolution 3072x 2304

Pixel Pitch 75 μm

Power Supply & Battery

Adapter In AC 100-240V,50-60Hz

Adapter Out DC 24V,2.7A

Power Dissipation <20 W

Image Quality
Limiting Resolution 5.9 LP/mm

Energy Range 40-150 KV

Dynamic Range ≥76 dB

Sensitivity ≥0.54 LSB/nGy

Ghos <1% 1st frame


Product Tags:

75 Micron A-Si DR

      

Amorphous Silicon A-Si DR

      

Various Fields A-Si DR

      
Quality 75 Micron Amorphous Silicon A Si For Various Fields A Si DR Non Destructive Testing wholesale

75 Micron Amorphous Silicon A Si For Various Fields A Si DR Non Destructive Testing Images

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